Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping, Second Edition

Introduction to Texture Analysis
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In geology, texture analysis can provide insight into some of the processes rocks have experienced during their geological history.

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Nowadays there are a selection of techniques available to analyze the texture of materials. These comprise the well-established methods of X-ray and neutron diffraction that give the global texture without reference to the location of individual grains within the sample macrotexture , and modern methods that allow the measurement of individual orientations microtexture in the transmission or scanning electron microscope directly related to the microstructure.

The latter methods, in particular electron backscatter diffraction in the scanning electron microscope, are able to measure orientations automatically from certain areas of the microstructure orientation mapping , thus also giving information on the grain and phase boundaries mesotexture. The second edition of Introduction to Texture Analysis provides a comprehensive coverage of the range of concepts, practices and applications of the techniques for determining and representing texture while keeping the mathematics to the minimum necessary.

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Focus is put on the modern techniques to study micro- and mesotexture, including diffraction of high-energy synchrotron radiation. It is the strength of the book that it gives a comparison and assessment of the experimental methods for texture analysis. Moreover, a few typical examples of texture research are presented. Thus, the second edition, which is an updated, corrected and improved version with better quality of the figures except Fig.

Issue contents. Groeber, David J. Rowenhorst, Michael D. Stephen D.

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Sintay, Michael A. Groeber, Anthony D.

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Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping, Second Edition - CRC Press Book. Introduction to texture analysis: macrotexture, microtexture and orientation mapping. By Olaf Engler and Valerie Randle. Pp. 2nd ed.

Nathan R. Barton, Joel V. Bernier, Ricardo A. Lebensohn, Anthony D. Surya R.

Books by Valerie Randle

Kalidindi, David T. Fullwood, Brent L.

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  • Electron Backscatter Diffraction in Materials Science;

David T. Fullwood, Surya R. Kalidindi, Brent L. Grain Boundary Networks. Angus J. Wilkinson, David J. Dingley, Graham Meaden.

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The attention is paid to applications of structure parameters in analysis structure - property relationships in engineering materials. Possibilities and limitations of individual experimental techniques are demonstrated on case studies.

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PhD students will learn about principles of the most important techniques of structure, diffraction and spectral analyses, with possibilities and limitations of individual techniques of structure characterisation, with fundamentals of interpretation of structure analysis results.

They will be able to define appropriate techniques of structure characterization needed to solve a problem and to prepare specimens for basic experimental techniques. Basic reasons and goals of structure characterization at a wide range of length scales macrostructure, microstructure, nanostructure.

Comparison of spatial resolution limits of microscopic techniques. Light microscopy.

Principle of light microscope. Preparation of specimens.

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Typical tasks of light microscopy at quality control of materials — microstructure, micro-cleanliness and grain size. Quantitative metallography, automated image analysis. Analysis of projected images. Errors of measurement. Interaction of X-ray and electrons with specimens. Basic rules for reciprocal lattice. Geometrical conditions of diffraction. X-ray diffraction analysis of polycrystalline materials.

Typical tasks of X-ray diffraction analysis.

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Quantitative analysis — methods of internal and external standards, standardless analysis.